Reliability
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Full citation: Bashir, Muhammad, and Linda Milor. “Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements.” IEEE Design & Test of Computers, November/December… Read more.
8–12 minutes -
Full citation: Milor, L., & Hong, C. (2010). “Area Scaling for Backend Dielectric Breakdown.” IEEE Transactions on Semiconductor Manufacturing, 23(3), 429–441. https://doi.org/10.1109/TSM.2010.2051730. Plain-Language Overview… Read more.
9–14 minutes -
Full citation: Ahmed, F., & Milor, L. (2012). “Analysis and On-Chip Monitoring of Gate Oxide Breakdown in SRAM Cells.” IEEE Transactions on… Read more.
10–15 minutes -
Full citation: Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, and Sung Kyu Lim, “Backend Dielectric Reliability Full Chip… Read more.
9–13 minutes -
Full citation: Chen, C.-C., & Milor, L. (2015). “Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms.” IEEE Transactions on… Read more.
8–12 minutes -
Full citation: Bashir, M. M., & Milor, L. (2015). “Impact of Linewidth on Backend Dielectric TDDB and Incorporation of the Linewidth… Read more.
11–16 minutes -
Full citation: Ahmed, F., and Milor, L. (2016). “Online Measurement of Degradation Due to Bias Temperature Instability in SRAMs.” IEEE Transactions on… Read more.
16–23 minutes -
Full citation: Kim, W., Chen, C.-C., Kim, D.-H., and Milor, L. (2016). “Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis… Read more.
16–24 minutes -
Full citation: Chen, C.-C., Liu, T., and Milor, L. (2016). “System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability… Read more.
16–24 minutes -
Full citation: Kim, D.-H., and Milor, L. (2017). “An ECC-Assisted Postpackage Repair Methodology in Main Memory Systems.” IEEE Transactions on Very Large… Read more.
15–23 minutes