Reliability
-
Full citation: Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, and Sung Kyu Lim, “Backend Dielectric Reliability Full Chip… Read more.
9–13 minutes -
Full citation: Chen, C.-C., & Milor, L. (2015). “Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms.” IEEE Transactions on… Read more.
8–12 minutes -
Full citation: Bashir, M. M., & Milor, L. (2015). “Impact of Linewidth on Backend Dielectric TDDB and Incorporation of the Linewidth… Read more.
11–16 minutes -
Full citation: Ahmed, F., and Milor, L. (2016). “Online Measurement of Degradation Due to Bias Temperature Instability in SRAMs.” IEEE Transactions on… Read more.
16–23 minutes -
Full citation: Kim, W., Chen, C.-C., Kim, D.-H., and Milor, L. (2016). “Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis… Read more.
16–24 minutes -
Full citation: Chen, C.-C., Liu, T., and Milor, L. (2016). “System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability… Read more.
16–24 minutes -
Full citation: Kim, D.-H., and Milor, L. (2017). “An ECC-Assisted Postpackage Repair Methodology in Main Memory Systems.” IEEE Transactions on Very Large… Read more.
15–23 minutes -
Full citation: Cha, S., Liu, T., and Milor, L. (2017). “Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits… Read more.
15–22 minutes -
Full citation: Liu, T., Chen, C.-C., and Milor, L. (2018). “Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for… Read more.
15–22 minutes -
Full citation: Yang, K., Liu, T., Zhang, R., and Milor, L. (2018). “A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both… Read more.
15–22 minutes
Linda Milor 