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Latest PAPERS
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Full citation: Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, and Sung Kyu Lim, “Backend Dielectric Reliability Full Chip… Read more.
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Full citation: Chen, C.-C., & Milor, L. (2015). “Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms.” IEEE Transactions on… Read more.
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Full citation: Bashir, M. M., & Milor, L. (2015). “Impact of Linewidth on Backend Dielectric TDDB and Incorporation of the Linewidth… Read more.
Linda Milor 