Reliability
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Full citation: Cha, S., Liu, T., and Milor, L. (2017). “Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits… Read more.
15–22 minutes -
Full citation: Liu, T., Chen, C.-C., and Milor, L. (2018). “Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for… Read more.
15–22 minutes -
Full citation: Yang, K., Liu, T., Zhang, R., and Milor, L. (2018). “A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both… Read more.
15–22 minutes -
Full citation: Kim, D.-H., Hsu, S.-H., and Milor, L. (2019). “Optimization of Experimental Designs for System-Level Accelerated Life Test in a… Read more.
14–21 minutes -
Full citation: Zhang, R., Liu, T., Yang, K., Chen, C.-C., and Milor, L. (2020). “SRAM Stability Analysis and Performance–Reliability Tradeoff for… Read more.
14–22 minutes -
Full citation: Wu, Y.-D., Yang, K., Hsu, S.-H., and Milor, L. (2020). “Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime… Read more.
11–17 minutes -
Full citation: R. Zhang, K. Yang, Z. Liu, T. Liu, W. Cai, and L. Milor, “A Comprehensive Framework for Analysis of… Read more.
10–15 minutes -
Full citation R. Zhang, T. Liu, K. Yang, and L. Milor, “CacheEM: For Reliability Analysis on Cache Memory Aging Due… Read more.
8–12 minutes