Time-Dependent Dielectric Breakdown
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Full citation: Bashir, Muhammad, and Linda Milor. “Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements.” IEEE Design & Test of Computers, November/December… Read more.
8–12 minutes -
Full citation: Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, and Sung Kyu Lim, “Backend Dielectric Reliability Full Chip… Read more.
9–13 minutes -
Full citation: Chen, C.-C., & Milor, L. (2015). “Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms.” IEEE Transactions on… Read more.
8–12 minutes -
Full citation: Kim, W., Chen, C.-C., Kim, D.-H., and Milor, L. (2016). “Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis… Read more.
16–24 minutes -
Full citation: Liu, T., Chen, C.-C., and Milor, L. (2018). “Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for… Read more.
15–22 minutes -
Full citation: Yang, K., Liu, T., Zhang, R., and Milor, L. (2018). “A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both… Read more.
15–22 minutes -
Full citation: Kim, D.-H., Hsu, S.-H., and Milor, L. (2019). “Optimization of Experimental Designs for System-Level Accelerated Life Test in a… Read more.
14–21 minutes -
Full citation: Wu, Y.-D., Yang, K., Hsu, S.-H., and Milor, L. (2020). “Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime… Read more.
11–17 minutes