FinFET Reliability
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Full citation: Yang, K., Liu, T., Zhang, R., and Milor, L. (2018). “A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both… Read more.
15–22 minutes -
Full citation: Wu, Y.-D., Yang, K., Hsu, S.-H., and Milor, L. (2020). “Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime… Read more.
11–17 minutes