bias temperature instability
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Full citation: Ahmed, F., and Milor, L. (2016). “Online Measurement of Degradation Due to Bias Temperature Instability in SRAMs.” IEEE Transactions on… Read more.
16–23 minutes -
Full citation: Kim, W., Chen, C.-C., Kim, D.-H., and Milor, L. (2016). “Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis… Read more.
16–24 minutes -
Full citation: Chen, C.-C., Liu, T., and Milor, L. (2016). “System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability… Read more.
16–24 minutes -
Full citation: Liu, T., Chen, C.-C., and Milor, L. (2018). “Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for… Read more.
15–22 minutes -
Full citation: Zhang, R., Liu, T., Yang, K., Chen, C.-C., and Milor, L. (2020). “SRAM Stability Analysis and Performance–Reliability Tradeoff for… Read more.
14–22 minutes -
Full citation: R. Zhang, K. Yang, Z. Liu, T. Liu, W. Cai, and L. Milor, “A Comprehensive Framework for Analysis of… Read more.
10–15 minutes