semiconductor reliability
-
Full citation: Bashir, Muhammad, and Linda Milor. “Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements.” IEEE Design & Test of Computers, November/December… Read more.
8–12 minutes -
Full citation: Milor, L., & Hong, C. (2010). “Area Scaling for Backend Dielectric Breakdown.” IEEE Transactions on Semiconductor Manufacturing, 23(3), 429–441. https://doi.org/10.1109/TSM.2010.2051730. Plain-Language Overview… Read more.
9–14 minutes -
Full citation: Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, and Sung Kyu Lim, “Backend Dielectric Reliability Full Chip… Read more.
9–13 minutes -
Full citation: Wu, Y.-D., Yang, K., Hsu, S.-H., and Milor, L. (2020). “Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime… Read more.
11–17 minutes -
Full citation R. Zhang, T. Liu, K. Yang, and L. Milor, “CacheEM: For Reliability Analysis on Cache Memory Aging Due… Read more.
8–12 minutes