Process Variation
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Full Citation Choi, M., & Milor, L. (2006). Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing. IEEE… Read more.
12–18 minutes -
Full citation: M. Choi and L. Milor, “Diagnosis of Optical Lithography Faults With Product Test Sets,” IEEE Transactions on Computer-Aided Design of… Read more.
9–13 minutes -
Full citation: Bashir, Muhammad, and Linda Milor. “Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements.” IEEE Design & Test of Computers, November/December… Read more.
8–12 minutes -
Full citation: Yang, K., Liu, T., Zhang, R., and Milor, L. (2018). “A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both… Read more.
15–22 minutes