Statistical Timing Analysis
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Full Citation: Orshansky, M., Milor, L., & Hu, C. (2004). Characterization of spatial intrafield gate CD variability, its impact on… Read more.
11–16 minutes -
Full citation: Chen, C.-C., Liu, T., and Milor, L. (2016). “System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability… Read more.
16–24 minutes