Microprocessor Reliability
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Full citation: Chen, C.-C., & Milor, L. (2015). “Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms.” IEEE Transactions on… Read more.
8–12 minutes -
Full citation: Chen, C.-C., Liu, T., and Milor, L. (2016). “System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability… Read more.
16–24 minutes