PAPERS
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Full Citation Orshansky, M., Milor, L., Chen, P., Keutzer, K., & Hu, C. (2002). Impact of spatial intrachip gate length… Read more.
15–22 minutes -
Full Citation: Orshansky, M., Milor, L., & Hu, C. (2004). Characterization of spatial intrafield gate CD variability, its impact on… Read more.
11–16 minutes -
Full Citation Choi, M., & Milor, L. (2006). Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing. IEEE… Read more.
12–18 minutes